X-Ray CT Inspection and Metrology
First Industrial Microct System With High-flux|Target And Scatter|Correct Technology
- scatter|correct: Highly improved CT quality level compared to conventional microfocus cone beam CT
- high-flux|target: Maintain high image quality and scan much faster, or with improved accuracy
- dynamic 41|100 detector: Doubled CT resolution at same scanning time or doubled throughput at same quality level compared to state of the art 200 μm pitch DXR detectors
- Unique dual|tube configuration for high power μCT as well as high resolution nanoCT®
- metrology|edition for precision measurements with up to 4+L/100 μm referring to VDI 2630 guideline
- Optional production|edition for fully automated high throughput CT inspection
- Max. sample size up to 500 mm Ø x 600 mm in height; 3D scanning area max. 290 mm Ø x 400 mm; up to 50 kg
Applications
- Light metal casting
- Electronics assembly
- Plastics molding
- Turbine blade inspection
- Internal defect analysis / 3D quanatitative porosity analysis
- Assembly control
- Materials structure analysis
